Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...

Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...

FormFactor has introduced DC-Boost, an advanced TRE test technology to increase probe test capacity. The new wafer-probe-card capability enables more efficient use of tester channels on test equipment ...

LIVERMORE, Calif., May 29, 2020 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe ...

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...

(SINGAPORE, November 12, 2009) – SV Probe (“SV”), a wholly owned subsidiary of SGX mainboard-listed Ellipsiz Ltd, today introduced GoldTouch™, a new Liquid Crystal Display (“LCD”) probe card ...

The probe card market is experiencing significant growth due to the increasing complexity of semiconductors in various industries. From consumer electronics to data centers, advanced ICs in sectors ...

HSINCHU, June 14, 2023 /PRNewswire/ -- STAr Technologies, a leading test system and probe card supplier to semiconductor industry, today announced the opening of a new probe card demo and potential ...